Author Archives: Antoine Hirsch

Protected: Computer-Aided Design (CAD) as a Metrological Tool (2014)

07/17/2014 by Antoine Hirsch · Comments Off on Protected: Computer-Aided Design (CAD) as a Metrological Tool (2014)

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Posted in Mendes, Metrology.

Protected: La métrologie de l’Égypte ancienne en tant que manifestation politique et illustration des rapports entre le centre et la périphérie.

08/13/2013 by Antoine Hirsch · Comments Off on Protected: La métrologie de l’Égypte ancienne en tant que manifestation politique et illustration des rapports entre le centre et la périphérie.

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Posted in Mendes.

Protected: Electronic Measuring Instruments

08/11/2013 by Antoine Hirsch · Comments Off on Protected: Electronic Measuring Instruments

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Posted in field.

Protected: Electronic Linear Measurements at Mendes (2013)

08/02/2013 by Antoine Hirsch · Comments Off on Protected: Electronic Linear Measurements at Mendes (2013)

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Posted in Mendes.

Volumetric Calculations (Twenty-Second Dynasty)

08/02/2013 by Antoine Hirsch · Comments Off on Volumetric Calculations (Twenty-Second Dynasty)

ISBN: 978-0-9811785-0-9

A few metrological remarks on a Twenty-Second Dynasty collection of partially reconstructed containers at Mendes.

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Posted in Mendes.